首頁  >  廠牌分類  >  Kewell  >  功率半導體測試與智能製造設備  >  MX300D系列IGBT動態測試系統

 

 

IGBT動態測試系統由高精度可編程直流電源、治具單元、測量控制單元、驅動控制單元、保護單元以及配套測試儀器等組成,採用公司自主開發的系統測試軟件,為IGBT動態特性參數提供一個穩定、精準的測試平台。

 

測試功能齊全,支持單脈衝測試、雙脈衝測試、柵極電荷檢測和短路測試;

 

可靠性高,系統自帶過流保護功能,在模塊失效發生時快速關斷電流迴路;

 

雜散電感量低,通過精巧的工藝設計,實現測試迴路低雜散電感量;

 

測量精度高,系統採樣單元配件均選用國際一線品牌;

 

系統採用軟硬件結合方式,具備全面安全保護措施; 

 

電源輸出電壓寬、電感負載檔位多,滿足各種動態測試需求;

 

具備強大的監控軟件,方便系統標準化操作及實時監控,測試工步及保護變量可在線設   置,操作簡單便利;強大的數據記錄分析能力,方便後期的數據處理。

Models & Specifications

 

Model

MX300D-1500-3000

Output

Voltage range

0-1500V

Voltage precision

0.1%FS

Voltage resolution

0.1V

Voltage measurement

. LeCroy oscilloscope (Resolution: 12 bit, 4-channel; Band width: 350MHz; Sampling rate: 2.5GS/s)

. YOKOGAWA 701977 differential voltage probe (Band width: 50MHz; Peak voltage: 7000V

Rated current

10~3000A

Current precision

±10%rdg

Current resolution

1A

Current measurement

. LeCroy oscilloscope (Resolution: 12 bit, 4-channel; Band width: 350MHz; Sampling rate: 2.5GS/s)

. CWT MINI 30B Rogowski coils

Parameters

Work mode

Laboratory mode/Production mode

Positive & negative gate voltages

0.5~30V

Gate voltage precision

2%FS

Gate voltage resolution

0.1V

Inductor load

20µH; 50µH; 100µH; 200µH; 500µH; 1000µH; 2000µH

Substrate temp. range

25~200℃

Substrate temp. precision

0.5%FS

Substrate temp. resolution

0.1℃

Reserved Interface

Fixture (adapter)

Customize according to IGBT models.

External load

Can be connected to user-selected devices

Gate resistance

Can be connected to user-selected devices

Gate capacitance

Can be connected to user-selected devices

Gate clamp

Can be connected to user-selected devices

Collector clamp

Can be connected to user-selected devices

Protection

Overcurrent

Overcurrent protection point is editable.

Fast protection activation.

Input

OVP/OCP/Over-load/Under-voltage/Phase loss etc.

Output

OVP/OTP/OCP etc.

Specifications

Protection level

IP21 (indoor)

Dimensions

805mm (D) × 1400mm (W) ×1915mm (H)

Ambient Temperature

25℃±10℃

*The information above is only valid for independent test equipment.

*The system is also available with production line testing solution.

*With Rogowski coils, the stray inductance of system loop reaches under 40nH, without considering the stray inductance of modules and fixtures; Pearson sensor is available as well, but the stray inductance may be higher than that of Rogowski coils.